Gold Standard Simulations (GSS) is the leader in the simulation of statistical variability in nano-CMOS devices. The services we offer include the physical simulation of statistical variability, statistical compact model extraction and statistical circuit simulation using ‘push button’ cluster-based technology.
Statistical variability of transistor characteristics, introduced by the discreteness of charge and matter, has become a major concern for CMOS scaling and integration, and demands fundamental changes in circuit and system design.
In addition to statistical variability, statistical aspects of reliability could reduce the life-span of contemporary CMOS circuits and systems from tens of years to 1-2 years, or less, in the near future.
GSS can help you to: